Post-manufacturing ECC customization based on Orthogonal Latin Square codes and its application to ultra-low power caches

by Rudrajit Datta, Nur A. Touba

Published in International Test Conference by IEEE.

2010 p212-218

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published

Year 2010

DOI 10.1109/test.2010.5699221
dblp conf/itc/DattaT10

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Post-manufacturing ECC customization based on Orthogonal Latin Square codes and its application to ultra-low power caches release_rmujyvtj7jefno2cdbetta42rm