Sparse statistical model inference for analog circuits under process variations

by Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi

Published in Asia and South Pacific Design Automation Conference by IEEE.

2014 p449-454

Type paper-conference
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published

Year 2014

DOI 10.1109/aspdac.2014.6742932
dblp conf/aspdac/ZhangSS14

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