Transmission electron microscopy analysis of C4H4S-doped MgB2 tapes release_qlvgd5cydfds3eqexknf4cs5nu

by N Yuzuriha, H Sosiati, S Hata, N Kuwano, H Yamada, N Uchiyama, A Matsumoto, H Kitaguchi, H Kumakura

Published in Journal of Physics, Conference Series by IOP Publishing.

2008   Volume 97, p012277

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