Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy

Masaki Kubota; Yoichi Ishida; Katsuaki Yanagiuchi; Hisashi Takamizawa; Yasuko Nozawa; Naoki Ebisawa; Yasuo Shimizu; Takeshi Toyama; Koji Inoue; Yasuyoshi Nagai

doi:10.1384/jsa.20.207

by Masaki Kubota, Yoichi Ishida, Katsuaki Yanagiuchi, Hisashi Takamizawa, Yasuko Nozawa, Naoki Ebisawa, Yasuo Shimizu, Takeshi Toyama, Koji Inoue, Yasuyoshi Nagai

Published in Journal of Surface Analysis by Surface Analysis Society of Japan.

2014 Volume 20, p207-210

Archived Files and Locations

application/pdf 392.1 kB
file_65gicyzdlrdflicj7z4chupogi www.sasj.jp (web)
web.archive.org (webarchive)

Read Archived PDF

Preserved and Accessible

Type article-journal
Stage

published

Year 2014
Language en ^?

DOI 10.1384/jsa.20.207

Journal Metadata
Not in DOAJ
In Keepers Registry
ISSN-L: 1341-1756

Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)

Cite This

BibTeX
CSL-JSON
MLA
Harvard

Lookup Links

oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar

Catalog Record
Revision: b94c0fb6-5dbf-4702-9ff4-77f2d99a4d8b
API URL: JSON

Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy release_pgbc4bmf4nb2nccsgwcgaryaje

Archived Files and Locations

Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy `release_pgbc4bmf4nb2nccsgwcgaryaje`