Fault-tolerant sub-lithographic design with rollback recovery

by Helia Naeimi, André DeHon

Published in Nanotechnology by IOP Publishing.

2008 Volume 19, Issue 11, p115708

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Date 2008-02-19

DOI 10.1088/0957-4484/19/11/115708
PubMed 21730568
Wikidata Q44835828

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