AUDIT: Stress Testing the Automatic Way release_nprlpjid7ff53dvjsaqdicz3au

by Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael Schulte, W. Lloyd Bircher, Madhu S. Sibi Govindan

Published in Annual IEEE/ACM International Symposium on Microarchitecture by IEEE.

2012   p212-223

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