Indirect and Adaptive Test of Analog Circuits Based on Preselected Steady State Response Measures

by Alvaro Gomez-Pau, Emili Lupon, Luz Balado, Joan Figueras

Published in IET Circuits, Devices & Systems by Institution of Engineering and Technology (IET).

2020

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Date 2020-02-21
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DOI 10.1049/iet-cds.2019.0191

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ISSN-L: 1751-858X

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Indirect and Adaptive Test of Analog Circuits Based on Preselected Steady State Response Measures release_na7owbvotfctnjuphzeamhohyq