Sparse statistical model inference for analog circuits under process variations

by Yan Zhang, Sriram Sankaranarayanan, Fabio Somenzi

Published in Asia and South Pacific Design Automation Conference by IEEE.

2014 p449-454

application/pdf 232.1 kB
file_ob3opdb2svdhvh7brparp5qswm web.archive.org (webarchive)
www.cs.colorado.edu (web)

Preserved and Accessible

Type paper-conference
Stage

published

Year 2014

DOI 10.1109/aspdac.2014.6742932
dblp conf/aspdac/ZhangSS14

Container Metadata
Not in DOAJ
Not in Keepers Registry

Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)

Cite This

BibTeX
CSL-JSON
MLA
Harvard

Lookup Links

Catalog Record
Revision: 46298331-b455-4317-ae23-79f1999c67a5
API URL: JSON

Sparse statistical model inference for analog circuits under process variations release_lvthmtidgzftvpm53vyskv55ve