@article{wang_su_chen_chen_huang_hung_huang_fan_tzeng_chou_2011, 
  title={Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs}, 
  volume={58}, 
  DOI={10.1109/ted.2010.2104153}, 
  publisher={Institute of Electrical and Electronics Engineers (IEEE)}, 
  author={Wang and Su and Chen and Chen and Huang and Hung and Huang and Fan and Tzeng and Chou}, 
  year={2011}
  }