Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction

by Shigeyuki Morishita, Jun Yamasaki, Keisuke Nakamura, Takeharu Kato, Nobuo Tanaka

Published in Applied Physics Letters by AIP Publishing.

2008 Volume 93, Issue 18, p183103

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Date 2008-11-03
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DOI 10.1063/1.3003582

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Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction release_hftgjdiq5nhp5ifkbvbwz2qwxi