HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis

by Y. Peng

Published in Journal of Electron Microscopy by Oxford University Press (OUP).

2004 Volume 53, p257-266

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Date 2004-06-01
Language en ^?

DOI 10.1093/jmicro/53.3.257
PubMed 15332652
Wikidata Q40486705

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ISSN-L: 0022-0744

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HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis release_hao6eh5dcjh47a2s5xgng3rdtm