Atomic delocalization as a microscopic origin of two-level defects in Josephson junctions

by Timothy C DuBois, Salvy P Russo, Jared H Cole

Published in New Journal of Physics by IOP Publishing.

2015 Volume 17, p023017

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Type article-journal
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published

Date 2015-02-04

DOI 10.1088/1367-2630/17/2/023017

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Atomic delocalization as a microscopic origin of two-level defects in Josephson junctions release_f7425gdmkzf33ecj7lybnjbhfa