Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer

by Xin Xie, Huilong Zhu, Mengying Zhang, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou

Published in IEICE Electronics Express by Institute of Electronics, Information and Communications Engineers (IEICE).

2019

application/pdf 2.4 MB `file_vyoegs6q4jcffkimm3ehhu3hta`	www.jstage.jst.go.jp (repository) web.archive.org (webarchive)
application/pdf 2.8 MB `file_ipyryfewbvgwze7itmwvusj5vq`	www.jstage.jst.go.jp (repository) web.archive.org (webarchive)

Preserved and Accessible

Type article-journal
Stage

published

Year 2019
Language en ^?

DOI 10.1587/elex.16.20190454

Container Metadata
Not in DOAJ
In Keepers Registry
ISSN-L: 1349-2543

Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)

Cite This

BibTeX
CSL-JSON
MLA
Harvard

Lookup Links

oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar

Catalog Record
Revision: 7bbcb016-845a-4160-b1da-cf7fa4e4d40e
API URL: JSON

Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer release_em3sjbfh4vb7nj76wc6jq7jxre