BibTeX
CSL-JSON
MLA
Harvard
Investigation of charge loss mechanisms in planar and raised STI charge trapping flash memories
release_efff62spr5cyhaxopdyhgt2cfu
by
Zhiliang Xia,
Dae Sin Kim,
Ju-Yul Lee,
Keun-Ho Lee,
Young-Kwan Park,
Moon-Hyun Yoo,
Chilhee Chung
Released
as a paper-conference
by IEEE.
2010
Archived Files and Locations
application/pdf
125.8 kB
file_h66ecnevubbftpuhhgw5yv2za4
| |
application/pdf
124.8 kB
file_3wstwnramnduxkxemrwqobhk64
|
web.archive.org (webarchive) in4.iue.tuwien.ac.at (web) |
Read Archived PDF
Preserved and Accessible
Type
Stage
Year 2010
paper-conferenceStage
unknown
Year 2010
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
access all versions, variants, and formats of this works (eg, pre-prints)
Cite This
Lookup Links
oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar
Crossref Metadata (via API)
Worldcat
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar