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Total Ionizing Dose Hardened and Mitigation Strategies in Deep Submicrometer CMOS and Beyond
release_crhxx7ltizanvblc7olxol2yfa
by
Eleni Chatzikyriakou,
Katrina Morgan,
cornelis de groot
Published
in IEEE Transactions on Electron Devices
by Institute of Electrical and Electronics Engineers (IEEE).
2018 Volume 65, p808-819
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