Weak Cell Detection in Deep-Submicron SRAMs: A Programmable Detection Technique

by A. Pavlov, M. Sachdev, J.P. De Gyvez

Published in IEEE Journal of Solid-State Circuits by Institute of Electrical and Electronics Engineers (IEEE).

2006 Volume 41, Issue 10, p2334-2343

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Year 2006
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DOI 10.1109/jssc.2006.881554

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