Exponential model deviations in reliability prediction of durable recoverable systems release_asn66tsyoffu7ifdmsp7j6uqj4

by V. M. Gribov, O. V. Kozhokhina, Yu. V. Hryshchenko

Published in Electronics and Control Systems by National Aviation University.

2016   Issue 48

Archived Files and Locations

application/pdf   1.6 MB
file_6s5funhj5fgafjuznalmpxgdte
jrnl.nau.edu.ua (publisher)
web.archive.org (webarchive)
Read Archived PDF
Preserved and Accessible
Type  article-journal
Stage   published
Date   2016-04-23
Container Metadata
Not in DOAJ
Not in Keepers Registry
ISSN-L:  1990-5548
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
Catalog Record
Revision: ca20caa6-d210-4ad5-9e46-758aff9afa82
API URL: JSON