BibTeX
CSL-JSON
MLA
Harvard
Exponential model deviations in reliability prediction of durable recoverable systems
release_asn66tsyoffu7ifdmsp7j6uqj4
by
V. M. Gribov,
O. V. Kozhokhina,
Yu. V. Hryshchenko
Archived Files and Locations
application/pdf
1.6 MB
file_6s5funhj5fgafjuznalmpxgdte
|
jrnl.nau.edu.ua (publisher) web.archive.org (webarchive) |
Read Archived PDF
Preserved and Accessible
Type
Stage
Date 2016-04-23
article-journal
Stage
published
Date 2016-04-23
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
access all versions, variants, and formats of this works (eg, pre-prints)
Cite This
Lookup Links
oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar