Breakdown voltage analysis for the new RESURF AlGaN/GaN HEMTs

Published in Scientia Sinica Informationis by Science China Press., Co. Ltd..

2012

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published

Year 2012
Language en ^?

DOI 10.1360/zf2012-42-6-770

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ISSN-L: 1674-7267

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Breakdown voltage analysis for the new RESURF AlGaN/GaN HEMTs release_ahq25k53nfhxfolkk2hyxy5gza