Analysis of TOF-SIMS spectra using quaternary ammonium ions for mass scale calibration

by Daisuke Kobayashi, Shinya Otomo, Hiroto Itoh

Published in Journal of Surface Analysis by Surface Analysis Society of Japan.

2014 Volume 20, p187-191

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Year 2014
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DOI 10.1384/jsa.20.187

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Analysis of TOF-SIMS spectra using quaternary ammonium ions for mass scale calibration release_adhupi4klre4jlhapreqgu4rz4