Statistical analysis of process variation based on indirect measurements for electronic system design

by Ivan Ukhov, Mattias Villani, Petru Eles, Zebo Peng

Published in Asia and South Pacific Design Automation Conference by IEEE.

2014 p436-442

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Year 2014

DOI 10.1109/aspdac.2014.6742930
dblp conf/aspdac/UkhovVEP14

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