From STEM to 4D STEM: Ultrafast Diffraction Mapping with a Hybrid-Pixel Detector
release_54cnxcgkejcgbkr7wj4bq3iebm
by
Daniel G Stroppa,
Matthias Meffert,
Christoph Hoermann,
Pietro Zambon,
Darya Bachevskaya,
Hervé Remigy,
Clemens Schulze-Briese,
Luca Piazza
Abstract
<jats:title>Abstract</jats:title>4D scanning transmission electron microscope (STEM) techniques have been increasingly featured among the electron microscopy characterization approaches, as they provide a perspective of improved information retrieval from samples overall. To make 4D STEM experiments as viable as conventional STEM image acquisition, the recording of diffraction patterns with a pixelated detector at fast frame rates, sufficient sensitivity to capture single electron hits, and high dynamic range is necessary. This paper addresses the recent development in hybrid-pixel detector technology that now allows 4D STEM experiments with a similar setup to conventional STEM imaging with pixel collection time under 10 µs. Application examples on virtual STEM detectors and crystal phase-orientation mapping are presented.
In application/xml+jats
format
Archived Files and Locations
application/pdf
6.5 MB
file_cdeyoulrovaohcwfmzqk5r3xkm
|
watermark.silverchair.com (publisher) web.archive.org (webarchive) |
access all versions, variants, and formats of this works (eg, pre-prints)
Crossref Metadata (via API)
Worldcat
SHERPA/RoMEO (journal policies)
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar