From STEM to 4D STEM: Ultrafast Diffraction Mapping with a Hybrid-Pixel Detector release_54cnxcgkejcgbkr7wj4bq3iebm

by Daniel G Stroppa, Matthias Meffert, Christoph Hoermann, Pietro Zambon, Darya  Bachevskaya, Hervé Remigy, Clemens Schulze-Briese, Luca Piazza

Published in Microscopy Today by Oxford University Press (OUP).

2023   Volume 31, p10-14

Abstract

<jats:title>Abstract</jats:title>4D scanning transmission electron microscope (STEM) techniques have been increasingly featured among the electron microscopy characterization approaches, as they provide a perspective of improved information retrieval from samples overall. To make 4D STEM experiments as viable as conventional STEM image acquisition, the recording of diffraction patterns with a pixelated detector at fast frame rates, sufficient sensitivity to capture single electron hits, and high dynamic range is necessary. This paper addresses the recent development in hybrid-pixel detector technology that now allows 4D STEM experiments with a similar setup to conventional STEM imaging with pixel collection time under 10 µs. Application examples on virtual STEM detectors and crystal phase-orientation mapping are presented.
In application/xml+jats format

Archived Files and Locations

application/pdf   6.5 MB
file_cdeyoulrovaohcwfmzqk5r3xkm
watermark.silverchair.com (publisher)
web.archive.org (webarchive)
Read Archived PDF
Preserved and Accessible
Type  article-journal
Stage   published
Date   2023-03-01
Language   en ?
Container Metadata
Not in DOAJ
In Keepers Registry
ISSN-L:  1551-9295
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
Catalog Record
Revision: ab3b5c6e-2069-4dcb-93a6-758186e4efd9
API URL: JSON