BibTeX
CSL-JSON
MLA
Harvard
A toolbox of metrology-based techniques for optical system alignment
release_47izvtm5bbaafoaegmlxbllq4u
by
Phillip Coulter,
Raymond G. Ohl,
Peter N. Blake,
Brent J. Bos,
Victor J. Chambers,
William L. Eichhorn,
Jeffrey S. Gum,
Theodore J. Hadjimichael,
John G. Hagopian,
Joseph E. Hayden,
Samuel E. Hetherington,
David A. Kubalak
(+6 others)
Released
as a paper-conference
by SPIE.
2016
Archived Files and Locations
application/pdf
1.5 MB
file_rqxhcb4vkjd25m777sjh25qw6q
| |
application/pdf
4.0 MB
file_hk2dqprvkvgwjnm2lqvjtjl7ti
|
ntrs.nasa.gov (web) web.archive.org (webarchive) |
application/pdf
1.0 MB
file_kz7me22mefdgjn67zwjuyhi4gm
|
ntrs.nasa.gov (web) web.archive.org (webarchive) |
application/pdf
3.9 MB
file_iduidkeggjcn7i37ri2o7zbp5q
|
ntrs.nasa.gov (web) web.archive.org (webarchive) |
Read Archived PDF
Preserved and Accessible
Type
Stage
Date 2016-10-20
paper-conferenceStage
unknown
Date 2016-10-20
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
access all versions, variants, and formats of this works (eg, pre-prints)
Cite This
Lookup Links
oaDOI/unpaywall (OA fulltext)
Crossref Metadata (via API)
Worldcat
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar
Crossref Metadata (via API)
Worldcat
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar