Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool

by Yoshinobu HIGAMI, Satoshi OHNO, Hironori YAMAOKA, Hiroshi TAKAHASHI, Yoshihiro SHIMIZU, Takashi AIKYO

Published in IEICE transactions on information and systems by Institute of Electronics, Information and Communications Engineers (IEICE).

2012 Volume E95-D, p1093-1100

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Year 2012
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DOI 10.1587/transinf.e95.d.1093

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ISSN-L: 0916-8532

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Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool release_3gptdna5pbblzaknmpm3ogq6iq