BibTeX
CSL-JSON
MLA
Harvard
Using SXDMEASURE: A New Method for Obtaining Accurate Lattice Parameters on the ISIS SXD Instrument
release_2nksaumcjzd5tookwcq3spq4ju
by
M W Johnson,
Craig Bull,
R J Nelmes,
M J Gutmann,
H Hamidov,
K Komatsu,
M Guthrie,
J S Loveday
Published
by STFC.
2013
Abstract
In this report we describe an improved method for determining the lattice parameters of a single-crystal sample using the neutron Laue time-of-flight (TOF) technique. The new method enables the measurement of unit cell lattice parameters with uncertainties in the range 0.015 – 0.06%. The method also improves the location, and integration, of weak reflections which are often more difficult to discern amongst the increased background at higher neutron energies. The method employs two related computer programs, SXDCALIB and SXDMEASURE. The first of these is used to calibrate the instrument, and the second used to determine the orientation matrix of an unknown sample, using the calibrated instrument parameters. This report describes how to use SXDMEASURE. SXDCALIB and the calibration procedure will be described in a separate report
In text/plain format
Archived Files and Locations
application/pdf
701.7 kB
file_m632vl6vn5fnrgw6ybefuwzsgy
|
epubs.stfc.ac.uk (publisher) web.archive.org (webarchive) |
Read Archived PDF
Preserved and Accessible
Type
Stage
Year 2013
article-journalStage
published
Year 2013
Work Entity
access all versions, variants, and formats of this works (eg, pre-prints)
access all versions, variants, and formats of this works (eg, pre-prints)
Cite This
Lookup Links
oaDOI/unpaywall (OA fulltext)
Datacite Metadata (via API)
Worldcat
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar
Datacite Metadata (via API)
Worldcat
wikidata.org
CORE.ac.uk
Semantic Scholar
Google Scholar