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Associated Releases

2015 One-dimentional statistical characteristics of binary random phase mask in the far-field diffraction pattern
published | article-journal
doi:10.18698/0236-3933-2015-5-97-108

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webarchive https://web.archive.org/web/20180721175354/http://vestnikprib.ru/articles/904/904.pdf
web http://vestnikprib.ru/articles/904/904.pdf

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SHA-256 6159a719077914c494a73379657c93c29f925ecca33cb3fbcb7376e6dd9acc00
MD5 0a80092124643fed61413c744bdb1145
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