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Associated Releases

2012 Breakdown voltage analysis for the new RESURF AlGaN/GaN HEMTs
published | article-journal
doi:10.1360/zf2012-42-6-770

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webarchive https://web.archive.org/web/20190428034435/http://engine.scichina.com/doi/pdf/5ced281abd00490a955fd21f0deabc0c
web http://engine.scichina.com/doi/pdf/5ced281abd00490a955fd21f0deabc0c

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SHA-1 978c8d1a9a24c4f7f2b18a23265033ac6982bc1b
SHA-256 88d483176b452aef82d56cbe6a4178addff767a699caa957f56c1b9da183e827
MD5 3e21d5decc80dafeabaf863872ee632d
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