Review of 2017, a test collection for IR patent research, an IP analytics special issue for 2018

by Jane List

Published in World Patent Information by Elsevier BV.

2017 Volume 51, A1-A2

Type article-journal
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published

Year 2017
Language en ^?

DOI 10.1016/j.wpi.2017.12.002

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ISSN-L: 0172-2190

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