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IEICE Electronics Express container_fvf4s3u4inbjpnfv6imirwcvam

Institute of Electronics, Information and Communications Engineers

Homepage URLs

https://www.jstage.jst.go.jp/browse/elex/list/-char/en
http://www.elex.ieice.org/

Example Publications

Effect of annealing residual stress on mobility of TSV vertical switch

Fengjuan Wang, Jiashuo Ren, Xiangkun Yin, Ningmei Yu, Yuan Yang, Kai Jing, Qian Li
2024 | IEICE Electronics Express
doi:10.1587/elex.21.20240208  
4,756
Known Releases
Preservation Summary [more]
4,434 preserved and accessble (bright)
120 preserved, inaccessible (dark)
202 no known preservation
Release Types
article-journal 4,756
ISSN-L?  1349-2543
    Electronic:  1349-2543
Wikidata  Q15766126
Directory Listings
Not in DOAJ
Lookup Links
ISSN Portal
The Keepers Registry (preservation)
SHERPA/RoMEO (access policies)
Catalog Record
Revision: 197d912d-e069-4f14-b30e-6ff79aef4dde
API URL: JSON