Journal of Surface Analysis
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The Surface Analysis Society of Japan
Showing first 25 out of 456 results
The Introduction of Common Data Processing System Version 12
Kazuhiro Yoshihara
2017
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Journal of Surface Analysis
doi:10.1384/jsa.23.138
Characterisation of nanomaterials: XPS analysis of Core-Shell Nanoparticles
Wolfgang S.M. Werner, Martin Hronek, Michael Stöger Pollach, Henryk Kalbe
2019
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Journal of Surface Analysis
doi:10.1384/jsa.26.102
Work Function and Band Alignment of Devices: Basics & Measurements
Michiko Yoshitake
2018
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Journal of Surface Analysis
doi:10.1384/jsa.25.115
Surface Micro-XAFS and Its Application to Real-time Observation of Organic Thin Films
Yuji Baba, Tetsuhiro Sekiguchi, Iwao Shimoyama, Norie Hirao
2011
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Journal of Surface Analysis
doi:10.1384/jsa.17.333
Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels
K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, Y. Takai
2011
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Journal of Surface Analysis
doi:10.1384/jsa.18.13
The Backscattering Factor for Systems with Non-uniform In-depth Profile
A. Jablonski
2009
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Journal of Surface Analysis
doi:10.1384/jsa.15.259
Photoemission Electron Spectroscopy V: Novel Topics
光電子分光法 V 最近のトピックス
J. D. Lee, T Nagatomi, G Mizutani, K Endo
2011
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Journal of Surface Analysis
doi:10.1384/jsa.18.36
The Role of TOF-SIMS in Elucidating Surface Phenomena of Polymeric Materials
Naohito Maeno, Mikinao Ito, Nao Takada
2019
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Journal of Surface Analysis
doi:10.1384/jsa.26.30
Errata to "Auger Electron Spectroscopy Analysis of W diffused from WC Grain into Co Regions in Cutting Tools" [<i>J. Surf. Anal.</i> 21, 2-9 (2014)]
Hiroshi Okumura, Kazuhisa Mine
2018
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Journal of Surface Analysis
doi:10.1384/jsa.25.136
Sample Handling and Sample Pretreatment
Sawa Araki
2019
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Journal of Surface Analysis
doi:10.1384/jsa.25.202
Novel approaches for analyzing nanoparticles using Atom Probe Tomography
Pyuck-Pa Choi, Se Ho Kim, Kyuseon Jang
2019
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Journal of Surface Analysis
doi:10.1384/jsa.26.140
Depth Analysis of Ta/NiFe/Ta/CoFeB/Ta/NiFe Multilayer Thin Films: Comparison of Atom Probe Tomography and Auger Electron Spectroscopy
Masaki Kubota, Yoichi Ishida, Katsuaki Yanagiuchi, Hisashi Takamizawa, Yasuko Nozawa, Naoki Ebisawa, Yasuo Shimizu, Takeshi Toyama, Koji Inoue, Yasuyoshi Nagai
2014
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Journal of Surface Analysis
doi:10.1384/jsa.20.207
Specimen preparation for three-dimensional atom probe using the focused ion-beam lift-out technique
T. Yamamoto, Y. Hanaoka, N. Mayama, T. Kaito, T. Adachi, M. Nojima, M. Owari
2011
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Journal of Surface Analysis
doi:10.1384/jsa.17.292
A Round Robin Test on XPS Transmission Function
N. Fukumoto, S. Tanuma, A. Tanaka, I. Kojima, K. Dohmae, SASJ XPS Transmission Project
2002
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Journal of Surface Analysis
doi:10.1384/jsa.9.524
Automated peak fitting of XPS spectrum using information criteria
Hiroshi Shinotsuka, Hideki Yoshikawa, Ryo Murakami, Kazuki Nakamura, Hiromi Tanaka, Kazuhiro Yoshihara
2019
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Journal of Surface Analysis
doi:10.1384/jsa.26.126
Ability in Surface Analysis of Soft X-ray XAFS taken with the Fluorescence Yield Mode —— Probing Depth and Self-Absorption Correction Method
Noriaki Usuki, Akiko Ito, Takeharu Adadhi, Hiroko Hayamizu, Keisuke Yamanaka
2018
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Journal of Surface Analysis
doi:10.1384/jsa.25.37
Surface Pretreatments for Remove of Native Cu Oxide Layer
Hyunjin Ju, Yong-Hyuk Lee, Youn-Seoung Lee, Sa-Kyun Rha
2011
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Journal of Surface Analysis
doi:10.1384/jsa.17.287
Results of Inter-laboratory Tests among SASJ on Accurate Mass Scale Calibration of ToF-SIMS
Yoshimi Abe, Hiroto Itoh, Shinya Otomo
2011
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Journal of Surface Analysis
doi:10.1384/jsa.17.186
Effects of Carbon Contaminations on Electron-Induced Damage of SiO<sub>2</sub> Film Surface at Different Electron Primary Energies
T. Nagatomi, H. Nakamura, Y. Takai, T. Ogiwara, T. Kimura, S. Tanuma
2011
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Journal of Surface Analysis
doi:10.1384/jsa.18.26
Energy and Direction Resolved Secondary Electron Imaging Using Fountain Detector
Takashi Sekiguchi, Toshihide Agemura, Hideo Iwai
2019
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Journal of Surface Analysis
doi:10.1384/jsa.26.148
Comparative Study on Nondestructive and Destructive Methods of Evaluating Thicknesses of Hot-dip Galvanized Coatings
Yasuhiro Higashi, Takashi Sawada
2014
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Journal of Surface Analysis
doi:10.1384/jsa.20.202
Evaluation of electrical conductivity of a perovskite-type oxide La<sub>1-x</sub>Sr<sub>x</sub>MnO<sub>3</sub> by x-ray photoemission spectroscopy
X線光電子分光法によるペロブスカイト型酸化物La<sub>1-x</sub>Sr<sub>x</sub>MnO<sub>3</sub>の導電性評価
Tomoko Hishida, Kazushige Ohbayashi, Tomohiko Saitoh
2017
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Journal of Surface Analysis
doi:10.1384/jsa.23.167
Fragment Distribution of Polystyrene by QMD Method Using the Model Hexamer
Koichiro Hayashi, Kousuke Moritani, Daisuke Matsumoto, Kozo Mochiji, Norio Inui, Kazunaka Endo
2010
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Journal of Surface Analysis
doi:10.1384/jsa.17.15
Laser Desorption Ionization Imaging Mass Spectrometry for Surface Analysis
レーザー脱離イオン化イメージング質量分析法による表面分析の可能性
Takaya Satoh, Makiko Fujii, Jiro Matsuo
2016
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Journal of Surface Analysis
doi:10.1384/jsa.23.2
Analysis of TOF-SIMS spectra using quaternary ammonium ions for mass scale calibration
Daisuke Kobayashi, Shinya Otomo, Hiroto Itoh
2014
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Journal of Surface Analysis
doi:10.1384/jsa.20.187
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