wikidata.org
International Test Conference
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Homepage URLs
http://www.itctestweek.org/ |
Example Publications
On-chip Timing Uncertainty Measurements on IBM Microprocessors
R. Franch, P. Restle, N. James, W. Huott, J. Friedrich, R. Dixon, S. Weitzel, K. Van Goor, G. Salem
2008
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International Test Conference
doi:10.1109/test.2008.4700707 dblp:conf/itc/FranchRNHFDWGS08
On-chip diagnosis for early-life and wear-out failures
M. Beckler, R. D. Blanton
2012
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International Test Conference
doi:10.1109/test.2012.6401580 dblp:conf/itc/BecklerB12
Non-invasive RF built-in testing using on-chip temperature sensors
E. Aldrete, M. Onabajo, J. Altet, D. Mateo, J. Silva-Martinez
2009
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International Test Conference
doi:10.1109/test.2009.5355901 dblp:conf/itc/Aldrete-VidrioOAMS09
A novel test flow for one-time-programming applications of NROM technology
Ching-Yu Chin, Yao-Te Tsou, Chi-Min Chang, Mango C.-T. Chao
2009
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International Test Conference
doi:10.1109/test.2009.5355537 dblp:conf/itc/ChinTCC09
Optimization methods for post-bond die-internal/external testing in 3D stacked ICs
Brandon Noia, Krishnendu Chakrabarty, Erik Jan Marinissen
2010
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International Test Conference
doi:10.1109/test.2010.5699219 dblp:conf/itc/NoiaCM10