Physical and Failure Analysis of Integrated Circuits (IPFA), IEEE International Symposium on the
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IEEE, Inc
Entity Metadata (schema)
container_type |
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issne |
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issnl |
1946-1542
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issnp |
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name |
Physical and Failure Analysis of Integrated Circuits (IPFA), IEEE International Symposium on the
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publication_status |
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publisher |
IEEE, Inc
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wikidata_qid |
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Extra Metadata (raw JSON)
country |
us
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issnp |
1946-1542
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kbart.portico |
{'year_spans': []}
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kbart.scholarsportal |
{'year_spans': [[2009, 2014], [2016, 2019]]}
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publisher_type |
society
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urls |
http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000562
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